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Lisa Pathfinder
LISA Pathfinder will test the technology needed to develop the ambitious ESA/NASA LISA mission. LISA (Laser Interferometer Space Antenna) aims at improving our knowledge of the universe by detecting gravitational waves, a phenomenon predicted by Einstein in 1916. LISA relies on technologies that are yet to be tested, so could not be built without its precursor LISA Pathfinder. LISA Pathfinder does not possess a classical payload with which to perform its scientific investigation, for the spacecraft as a whole is used to pursue its objective. The core of the experiment is the inertial sensor, the LISA Technology Package (LTP), containing the proof masses and the accurate metrology system. Two micro-propulsion systems are present: one based on Field Emission Electric Propulsion (FEEP) developed in Europe and one based on Colloidal thrusters, developed in the USA and provided by NASA. The inertial sensor and the two micro-propulsion systems are controlled by two drag-free control software packages, one residing in the European on-board computer and one provided by JPL, called the Disturbance Reduction System (DRS), residing on a dedicated computer. The launch of LISA Pathfinder is planned for 2010. Following the transfer to its operational orbit, initial set-up and calibration phases, the in-flight demonstration of the LISA technology will take place (90 days LTP, 70 days DRS), providing timely feedback for the development of the LISA mission.
Laser Scanning from NDI - take non-contact, point-cloud measurement to a higher level
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NDI Laser Scanning - take non-contact, point-cloud measurement to a higher level http://www.ndi.ca/industrial Quickly bring physical parts into the digital domain with handheld laser scanners that combine instant tracking performance with high-speed, non-contact surface scanning. - Perform walkabout scanning without beam-breaks, mechanical linkages, or photogrammetry targets - Use your preferred data collection program - all major point-cloud software applications are supported - Conduct freeform scanning of difficult geometries from multiple angles of approach - Reduce operator fatigue with ergonomic and lightweight scanner designs - Use the system’s large measurement volume to scan large parts in one setup - Measure difficult surfaces without powder or spray, including shiny black - Measure accurately in unstable environments with Dynamic Referencing (near stamping presses, forklifts, vibrating machinery, etc) |
Laser Scanning - take non-contact, point-cloud measurement to a higher level
NDI Laser Scanning - take non-contact, point-cloud measurement to a higher level http://www.ndi.ca/industrial Quickly bring physical parts into the digital domain with handheld laser scanners that combine instant tracking performance with high-speed, non-contact surface scanning. - Perform walkabout scanning without beam-breaks, mechanical linkages, or photogrammetry targets - Use your preferred data collection program - all major point-cloud software applications are supported - Conduct freeform scanning of difficult geometries from multiple angles of approach - Reduce operator fatigue with ergonomic and lightweight scanner designs - Use the system’s large measurement volume to scan large parts in one setup - Measure difficult surfaces without powder or spray, including shiny black - Measure accurately in unstable environments with Dynamic Referencing (near stamping presses, forklifts, vibrating machinery, etc)
Non-contact 3D Topography Measurement of Solar Cells
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High accuracy 3D topography measurement with just a light beam. This video shows a 3D topography measurement of a solar cell conductor (finger). The used system is the NEMESIS VVX scanning system from Precitec Optronik GmbH in Germany. The used optical sensor is the chromatic white-light sensor CHRocodile E. The accuracy of this surface measurement is 100 nm. More information under: www.precitec-optronik.de This system can also measure the thickness of wafers and solar cells from one side without contact. |
Survice Metrology
From our metrology center in northeastern Maryland as well as its portable field … SURVICE Metrology Tech Expo … SURVICE Metrology was recently at the …
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SI is being put into use worldwide except couple of countries.Their deeds are weeds for every human being effecting global economics |
Hexagon Metrology Holiday Greeting 2007
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Hexagon Metrology wishes our Customers, Suppliers and Friends all the best this Holiday Season and in the coming year. The Hexagon Metrology group consists of the following brands |
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay, acoustic film thickness, dopant dose, junction depth, and electrical measurements; particle and defect detection; and flatness following chemical mechanical polishing. Providing examples of well-developed metrology capability, the book focuses on metrology for lithography, transistor, capacitor, and on-chip interconnect process technologies.
In modern industrial environments where responsibility for quality control is being placed upon individual workers, the understanding of dimensional metrology principles is becoming increasingly important. That’s why the fifth edition of our best-selling Fundamentals of Dimensional Metrology book offers a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field today. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples for greater consistency with the latest industry trends. Information on particular devices and concepts, previously presented in separate chapters, has been combined to improve the logical flow of the material. New chapter-end review questions have also been added to eliminate the potential for ambiguity, allowing readers to gauge their understanding as they progress through the book.
